L. I. Diakonov, V. V. Probylov
The Federal State United Enterprise “Alpha”, Moscow, Russia
The simple and precise method of I—V curve measurement is developed. The method suit for IR-photoconductors (IRPC) characterization. It allows to obtain quickly the I—V table with the accuracy up to 0.01 % from more than 40 separate values. The data of the table are treated in a PC for: (a) data correction, (b) deriving R = f (V) dependence and (c) calculation of power dissipated by photoconductor. The R = f (V) graphs fit better then I—V dependences for the characterization of IRPC properties on ageing, after heat treatment and on manufacturing technology changes.
