Article: Trap assisted tunneling in structures with degenerated n+ - p junction on the basis of (CdHg)Te narrow gap alloys Infra-red focal plane arrays: state-of-the-art and development trends

A. Yu. Selyakov, V. P. Ponomarenko
ORION Research-and-Production Association, Moscow, Russia

Trap assisted tunneling in degenerated n+-p HgCdTe junction was analyzed. Approach of single recombination level located in top part of bandgap was used. Recombination rate and differential resistance of p-n-junction R0A was calculated. It is shown, that when the temperature decrease below some value It take place a changing of transition type controlled the recombination in space charge region. The changing of transition type explain experimentally observable effect of saturation of R0A temperature dependence in low temperature region.